The PROFILER R is a compact roughness sensor that offers a more accurate alternative to manual roughness measurements. It enables quick and straightforward surface profile inspections within a standard coordinate measuring machine (CMM) application. With the PROFILER R, surface profile inspection can be integrated into the measurement program without the need to reclamp the workpiece. Its ability to automatically switch between multiple scanning sensors allows it to measure all standard roughness metrics.
For Leitz CMMs, the PROFILER R provides a tactile surface assessment method. By incorporating additional measurement capabilities into the machine’s standard functionalities, profile inspections can become a routine part of the quality control process, ensuring that all relevant workpiece parameters are accurately verified.
Features & Benefits
Automatic Sensor Swapping
To enhance efficiency and reduce setup and transportation times, the PROFILER R can automatically switch sensors on the probe head within the same program, complementing existing scanning sensors for coordinate measuring machines (CMMs).
Combined Pivoting and Rotating Axis
With a measurement range of up to 15 mm, the PROFILER R features 360° rotation and 180° pivot capabilities. This design maximizes component accessibility and simplifies programming, requiring less effort from the operator.
Exceptional Precision
Compared to manual profiling, the PROFILER R’s integration with the probe head significantly reduces error margins and eliminates the need for additional equipment, all while providing outstanding positioning accuracy.
Wireless Operation
The PROFILER R’s wireless data transmission enhances its versatility and is powered by the probe head, allowing for easy sensor exchanges.
Technical Data
Measuring principle | Contact profile method (Reference area system) |
Measuring section | Max. 15 mm |
Stylus radius | 2 μm (5 μm available on request) |
Stylus elbow | 90° |
Filter | Gauss* |
Integrated axis | Rotating: 360° Pivoting: 180° |
Weight | 630 g |
Software | QUINDOS |
Evaluation standards | According to ISO 4287 / 13565 |
Roughness parameters (Stylus radius 2 µm) |
Rz, Rt: Up to 10 µm Ra: 50 nm up to 2 µm |
* Others available on request