HP-OW Optical Sensors

Chromatic white-light spectroscopy is utilized by the HP-OW sensor to accurately detect a wide variety of surface finishes for different applications. This sensor achieves a resolution in the nanometer range and can measure over several millimeters. With a broad acceptance angle of up to ±30°, it provides versatility in measurement options, making it suitable for assessing both large surfaces and small details.

The highest level of measurement flexibility is ensured when HP-OW optical sensors are used in conjunction with a coordinate measuring machine (CMM) equipped with touch sensors. The HP-OW probes are available in three different types, allowing customization to meet various metrology requirements, such as working distances and measurement ranges. When paired with the HR-R sensor rack, the inspection cycle time is significantly reduced.

Features and Benefits

Perfect for demanding measuring applications

The HP-OW can be utilized for applications that are often difficult to measure, like bright surfaces, glass, and other transparent/reflective or sensitive materials, because of its unique measurement concept and large size range. The HP-OW is also capable of measuring the thickness of workpiece regions.

Calibration of Artefact Spiral scan

The HP-OW significantly reduces the process time by running in spirals across the calibration sphere rather of recording many measurement points independently. PC-DMIS automatically chooses the parameters.

Transfer: Automatic probe exchange

To attain the maximum degree of flexibility, the HP-OW sensor can be swapped out for various Hexagon sensors during the measurement program in conjunction with a probe head.